Electrical
Properties
Electrical and thermoelectric properties – Precise characterization of materials
Accurate characterization of the electrical and thermoelectric properties of materials.
Electrical Properties
LSR – High-precision thermoelectric characterization
LINSEIS LSR systems enable precise and simultaneous measurement of the Seebeck coefficient, electrical resistance, and, using the Harman method, the thermoelectric performance index ZT. Designed for a wide temperature range and various sample geometries, they deliver reproducible and reliable results for research, development, and advanced characterization of thermoelectric materials.
HCS – Hall effect analysis for semiconductor characterization
LINSEIS HCS systems enable the precise characterization of fundamental electrical properties of semiconductors and thin films, such as charge carrier density and mobility. Based on the analysis of the Hall effect over a wide range of temperatures and magnetic fields, they provide reliable and reproducible results for research, development, and advanced analysis of electronic materials.
TEG L34 – Tester for thermoelectric generators and Peltier elements
The LINSEIS TEG L34 is an advanced measurement system for the comprehensive characterization of thermoelectric generators (TEGs) and Peltier modules under real-world operating conditions. It enables the precise evaluation of performance, efficiency, and energy behavior by applying controlled thermal gradients or currents. With flexible operating modes and fast data acquisition, the TEG L34 is a powerful solution for research, development, and long-term testing of thermoelectric systems.
Thin Film Analyzer
LINSEIS solutions for thin film analysis enable the precise determination of physical properties as a function of thickness and temperature. They meet the specific requirements of thin film technologies in research and industry, particularly for semiconductors, functional materials, and high-performance applications.